《IRE STANDARDS ON ELECTRON TUBES METHODS OF TESTING 1962》PDF下载

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ELECTRON TUBES AND STANDARD COMMITTEES PERSONNEL 3

PREFACE 4

PART 1: CONVENTIONAL RECEIVING TUBES 8

1.Introduction 8

1.1 General Precautions 8

1.2 General Test Conditions 8

2 Filament or Heater Characteristics 8

2.1 Filament or Heater Electrical Characteristics 8

2.2 Filament or Heater Heating Characteristics 9

2.3 Cathode Heating Time 9

2.4 Cathode Cooling Time 10

2.5 Operation Time 10

3 Emission Tests 10

3.1 Measurement of Flection-Point Emission Current 10

3.2 Measurement of Inflection-Point Emission Current 11

3.3 Comparison of Emission Currents of Tubes it 12

3.4 Measurement of Field-Free Current 12

3.5 Emission Checks 12

4 Characteristics of an Electron Tube 13

4.1 Static Characteristics 13

4.2 Load (Dynamic) Characteristics 13

4.3 Perveance 14

4.4 Pulse Methods 14

5 Residual Gas and Insulation Tests 18

5.1 Total Current to a Negatively Biased Control Grid 18

5.2 Measurement of Gas (Ionization) Current 19

5.3 Leakage Currents 20

6 Inverse Electrode Currents 21

6.1 Thermionic Grid Emission 21

6.2 Seconda Grid Emission 21

6.3 Reverse Emission in Rectier Diodes (Back Emis-sion) 22

6.4-Primary Screen-Grid Emission 23

6.5 Primary Anode Emission 23

7 Vacuum-Tube Admittances 23

7.1 Direct Interelectrode Capacitances 25

7.2 Vacuum-Tube Coefcients 27

7.3 Four-Pole Admittances 33

8 Nonlinear Characteristics 36

8.1 Detection Characteristics 36

8.2 Conduction for Rectication 37

9 Audio Power Output 37

9.1 Measurement of Harmonics 38

9.2 Measurement of Power Output at Audio Frequency 38

9.3 Measurement of Push-Pull Power Output at AudioFrequencies 38

10 Radio-Frequency Operating Tests for Power-OutputTubes 39

10.1 Determination of RF Power Output 39

10.2 Grid Driving Power 39

11 Electrode Dissipation and Bulb Temperature 40

11.1 Methods of Measuring Anode Dissipation 40

11.2 Methods of Measuring Grid Dissipation 40

11.3 Methods of Measuring Bulb Temperature 41

12 Bibliography 41

PART 2: CATHODE-RAY TUBES 43

1.Introduction 43

1.1 Scope 43

1.2 Reference to Methods of Testing Other Tubes 43

1.3 Precautions 43

1.4 Ambient Light 43

1.5 Operating Conditions 43

2 Instructions for Test 44

2.1 Cutoff Voltage 44

2.2 Leakage Currents 44

2.3 Electrode Currents 45

2.4 Gas Content 45

2.5 Cathode-Ray-Tube Capacitances 45

2.6 Focusing-Electrode Voltage of Electrostatic-FocusTypes 45

2.7 Focusing-Coil Current of Magnetic-Focus Types 45

2.8 Deection Factor of Electrostatic-Deection Types 46

2.9 Deection Factor of Magnetic-Deection Types 46

2.10 Screen Luminance 46

2.11 Chromaticity of Screen Luminescence 48

2.12 Screen-Persistence Characteristic 51

2.13 Large-Area Contrast 52

2.14 Resolution 53

3 Bibliography 56

PART 3: GAS TUBES 57

1 Introduction 57

1.1 General Precautions 57

2 Hot-Cathode Gas-Tube Tests 57

2.1 Filament or Heater Electrical Characteristic 57

2.2 Control-Characteristic Tests 57

2.3 Emission Tests 58

2.4 Grid-Current Tests 58

2.5 Fault-Current Test (Surge-Current Test) 58

2.6 Operation Test 58

2.7 Thermal Tests for Hot-Cathode Mercury Tubes 60

2.8 Recover-Time Test 61

2.9 Thyratron Ionization-Time Test 63

3 Cold-Cathode Gas-Tube Tests 63

3.1 General Precautions 63

3.2 Breakdown-Voltage Tests 63

3.3 Anode-Voltage-Drop Tests 63

3.4 Transfer-Current Test 64

3.5 Voltage-Regulator-Tube Regulation Test 64

3.6 Drift Rate 64

3.7 Repeatability 64

3.8 Temperature Coefcient of Voltage Drop 64

3.9 Voltage Jump 64

PART 4: MICROWAVE-DUPLEXER TUBES 65

1 Introduction 65

2 Low-Level Radio-Frequency Measurements 65

2.1 Tuning-Susceptance (ATR Tubes) 65

2.2 Normalized Equivalent Conductance (ATR Tubes) 66

2.3 Loaded Q (ATR Tubes) 67

2.4 Mode Purity (ATR Tubes) 67

2.5 Insertion Loss (TR Tubes) 68

2.6 Low-Level VSWR (TR Tubes) 6g 69

2.7 Ignitor Interaction (TR Tubes) 69

2.8 Low-Level Phase Shift (TR Tubes) 69

2.9 Low-Level VSWR (Dual TR Tubes) 69

2.10 Transmitter-Receiver Isolation (Dual TR Tubes) 70

2.11 Loaded Q (High-Q TR Tubes) 70

2.12 Unloaded Q (High-Q TR Tubes) 70

2.13 Resonance Frequency (High-Q TR Tubes) 71

2.14 Tuning Range (High-Q TR Tubes) 71

2.15 Frequency-Temperature Drift (High-Q TR Tubes) 71

2.16 Insertion Loss (High-Q TR Tubes) 71

3 High-Level Radio-Frequency Measurements 71

3.1 Recovery Time (ATR Tubes) 71

3.2 ATR Arc Loss 72

3.3 ATR High-Power-Level VSWR 73

3.4 ATR High-Power-Level Firing Time 73

3.5 Recovery Time (TR and Pre-TR Tubes) 73

3.6 Position of Effective Short (TR and Pre-TR Tubes) 74

3.7 Leakage Power (TR and Pre-TR Tubes) 74

3.8 Minimum Operating Power (TR and Pre-TR Tubes) 76

3.9 Phase-Recovery Time (TR and Pre-TR Tubes) 76

4 Ignitor-Electrode Measurements 76

4.1 Ignitor Voltage Drop 76

4.2 Ignitor Firing Time 77

4.3 Ignitor Oscillations 77

4.4 Ignitor-Leakage Resistance 77

PART 5: PHOTOTUBES 78

1Introduction 78

1.1 Classication of Phototubes 78

1.2 Characteristics 78

2 Sensitivity 78

2.1 Luminous Sensitivity 78

2.2 Illumination Sensitivity 80

2.3 Response to Filtered Light 81

2.4 Radiant Sensitivity (Monochromatic) 81

2.5 Quantum Efciency 82

2.6 Spectral-Sensitivity Characteristic 82

2.7 Uniformity of Sensitivity of Phototubes 82

2.8 Fatigue 82

3 Current Amplication 82

3.1 Gas-Amplication Factor of a Phototube 82

3.2 Current Amplication of a Multiplier Phototube 83

4 Current-Voltage Characteristics 83

4.1 Diode Phototube 83

4.2 Multiplier Phototube 83

5Dynamic Characteristics 84

5.1 Dynamic-Sensitivity Characteristics of a Gas Photo-tube 84

5.2 Pulse Response 84

5.3 Variation in Transit Time with Position of Illumina-tion 85

6 Electrode Dark Current 85

6.1 Anode Dark Current 85

6.2 Equivalent Anode-Dark-Current Input 86

6.3 Temperature Characteristic of Dark Current 86

6.4 Electrode Dark Current in a Multiplier Phototube 86

7 Noise in Multiplier Phototubes 86

7.1 Signal-to-Noise Ratio 86

7.2 Equivalent Noise Input 87

7.3 Ratio of Signal-to-Noise-in-Signal 87

8 Collection Eiciency 87

8.1 Uniformity of Collection Efciency 87

9 Peak-Output-Current Limitations 88

9.1 Space-Charge-Limited Output Current 88

9.2 Peak Output Current Limited by High Cathode Re-sistivity 88

10 Denitions 89

10.1 Equivalent Noise Input (of a Phototube) 89

10.2 Sensitivity (of a Photosensitive Electron Device) 89

10.3 Sensitivity, Dynamic (of a Phototube) 89

10.4 Sensitivity, Radiant (Camera Tubes or Phototubes) 89

10.5 Transit Time (of a Multiplier Phototube) 89

10.6 Transit-rime Spread 89

PART 6: MICROWAVE TUBES 90

Introduction 91

ANonoperating Characteristics 91

1 Resonance-Frequency Measurements 91

1.1 Reflection Method 91

1.2 Transmission Method 91

2 Measurements 91

2.1 Overcoupled Case (Output Losses Neglected) 92

2.2 Undercoupled Case (Output Losses Neglected) 93

3Phase of Frequency-Sink Measurements 94

4Measurement of Dispersion Characteristics, Uniform In-teraction Circuit 94

B Microwave Oscillators 95

5Power Output 95

5.1 Measurement of Average Power 95

5.2 Measurements of Peak Power 95

6Methods of Measurement of Frequency 96

6.1 Measurements with an Accuracy of One Part in 106or Better 96

6.2 Measurements with an Accuracy of the Order of OnePart in 96

7Method of Measurement of Microwave Local-OscillatorNoise 97

8Transmitting-Oscillator Noise 98

8.1 Spectrum Measurement 98

8.2 Amplitude-Modulation Noise 98

8.3 Angle-Modulation Noise 99

9Loading Effects 99

10Methods of Measurement of Mechanical Tuning Charac-teristics of Microwave-Oscillator Tubes 100

10.1 Calibration 101

10.2 Resetability 101

10.3 Stability 101

10.4 Life 101

10.5 Starting Force (or Torque) 101

10.6 Operating Force (or Torque) 101

11 Electrical Tuning 101

12 Modulation of CW Oscillators 102

12.1 Amplitude Modulation 102

12.2 Frequency Modulation 102

12.3 Distortion 103

12.4 Carrier-Frequency Shift 103

13 Pulsed-Oscillator Measurements 103

13.1 Measurement of RF Spectrum 103

13.2 Pulse Jitter and Missing Pulses 104

14 Spurious Oscillations 106

14.1 CW Oscillators 106

14.2 Pulsed Oscillators 107

15 Frequency Pushing 108

15.1 Static-Pushing Measurement 108

15.2 Dynamic-Pushing Measurement 108

CMicrowave Amplierslo 109

16 Matched Gain (Microwave Amplifier) 109

16.1 Direct Method 109

16.2 Indirect Method 109

17Input-Impedance Measurements 110

17.1 Measurement of Standing-Wave-Ratio S 110

17.2 Measurement of the Reference Angle 110

18Output-Impedance Measurements 110

18.1 Measurement of Standing-Wave-Ratio s 110

18.2 Measurement of Reference Angle 111

19 Measurement of Amplier Bandwidth 111

20.Measurement of Amplier Loss 111

20.1 Circuit Insertion Loss 111

20.2 Backward Loss 111

21.Phase Measurements ill 111

21.1 Fixed-Frequency Tests 111

21.2 Variable-Frequency Test 112

21.3 Time-Delay Measurement 112

22.Noise Factor, Noise Figure 112

23.Carrier-to-Noise Fluctuations 112

23.1 Amplitude Fluctuations 112

23.2 Phase Fluctuations 113

24.Frequency Range 114

25.Amplier Power Output 114

25.1 Amplier Fundamental Power Output 114

25.2 Harmonic Power Output 114

26.Conditional Oscillations 114

27.Intermodulation 115

27.1 Amplitude Distortion 115

27.2 Phase-to-Amplitude Conversion 115

27.3 Phase Distortion 116

27.4 Amplitude-to-Phase Conversion 116

27.5 Multisignal Intermodulation (Frequency-Conver-sion Eect) 116

27.6 Cross Modulation 117

28 Modulation Characteristics 118

29 Testing of Microwave Ampliers Under Pulse Conditions 118

29.1 Pulse Shape and Spectrum 119

29.2 Pulse-to-Pulse Phase Coherence 119

29.3 Cuto Characteristics 120

29.4 Pulse Echoes (Internal Reections) 120

30 Test for Voltage-Tunable Ampliers 121

30.1 The Tuning Characteristic 121

30.2 Start-Oscillation Characteristic 121

31 Tests for Frequency Multipliers 121

32 Stability of Characteristics 121

33 Additional Denitions of Terms for Tunable MicrowaveOscillators 121

33.1 Tuning Range (of Oscillator) 21

33.2 Tuning Sensitivity (of Oscillator) 121

33.3 Tuning Creep (of Oscillator) 121

33.4 Response Time (of an Electrically-Tuned Oscillator) 121

33.5 Resetability (of Oscillator) 121

33.6 Hysteresis 121

33.7 Backlash 121

33.8 Electrically-Tuned Oscillator 121

PART 7: CATHODE-INTERFACE IMPEDANCE 122

1 Introduction 122

1.1 General Comments 122

1.2 General Test Conditions 123

1.3 Measurement Circuits 123

1.4 Complementary-Network Bridge 124

1.5 Shunt-Admittance Method 126

1.6 Standard-Tube-Comparison Method 126

1.7 Dierential-Comparison Method 126

1.8 CW Method 126

2 Bibliography 127

PART 8: CAMERA TUBES 128

1 Introduction 128

1.1 Denitions 128

2 Test Equipment 128

2.1 Design and Adjustment of Test Equipment 128

2.2 Specication of Test Results 129

3 Methods of Test 130

3.1 Measurement of Transfer Characteristic 13

3.2 Measurement of Noise 130

3.3 Measurement of Resolution 131

3.4 Measurement of Persistence Characteristic 132

3.5 Measurement of Spectral-Sensitivity Characteristic 133

3.6 Miscellaneous Tests 133

4.Selected Bibliography 134

PART 9: NOISE IN LINEAR TwoPORTS 135

1 Introduction 135

2 Noise Factor 135

2.1 Variation of Noise Factor with Source Admittance 13

2.2 Average Noise Factor 136

3 Measurement of Average Noise Factor 136

3.1 CW-Signal-Generator Method 137

3.2 Dispersed-Signal-Source Method 138

3.3 Comparison Methods of Noise Measurement 139

3.4 Precautions 139

4 Measurement of Spot-Noise Parameters 140

4.1 Noise Factor of Transducers in Cascade 140

4.2 The Noise Parameters Fo, Go, Bo, and Rn 140

Appendix: Representation of Noise in Linear Twoports 143

1 Introduction 143

2 Representations of Linear Twoports 143

3 Representations of Stationary Noise Sources 144

4 Relationship of Spectral Densities and Fourier Ampli-tudes to Mean-Square Fluctuations 145

5 Noise Transformations by Linear Twoports 146

6 Conclusion 148

PART 10: CATHODE-RAY CHARGE STORAGE TUBES 149

1.Introduction 149

2.Types of Cathode-Ray Charge Storage Tubes 149

2.1 Classication by Output 149

2.2 Classication by Deection Pattern 149

2.3 Combination Storage Tubes 149

3 Measurement of Resolution 149

3.1 Resolution of Scanned Electrical-Signal StorageTubes 150

3.2 Resolution of Electrical-Visual Storage Tubes 150

3.3 Resolution of Beam-Indexed Electrical-SignalStorage Tubes 151

4 Measurement of Writing Speed or Writing Time 151

4.1 Writing Speed of Scanned Electrical-Signal StorageTubes 151

4.2 Writing Speed of Scanned Electrical-Visual StorageTubes 151

4.3 Writing Time of Beam-Indexed Electrical-SignalStorage Tubes 151

4.4 Writing Time of Beam-Indexed Electrical-VisualStorage Tubes 151

5 Measurement of Erasing Speed or Erasing Time 152

5.1 Erasing Speed of Scanned Electrical-Signal StorageTubes 152

5.2 Erasing Speed of Scanned Electrical-Visual StorageTubes 152

5.3 Erasing Time of Beam-Indexed Electrical-SignalStorage Tubes 153

5.4 Erasing Time for Flood-Gun Operation in Electrical-Visual Storage Tubes 153

6 Measurement of Retention Time 153

7 Measurement of Reading Characteristics 153

7.1 Measurement of Read Number 153

7.2 Read Time of Beam-Indexed Storage Tubes 153

7.3 Read-Around Number of Beam-Indexed StorageTubes 154

7.4 Measurement of Viewing Time for Visual OutputTubes 154

8 Measurement of Decay Time 154

8.1 Static Decay Time 154

8.2 Dynamic Decay Time 154

9 Measurement of Signal-to-Shading Ratio 154

9.1 Signal-to-Shading Ratio of Electrical-Signal StorageTubes 155

9.2 Signal-to-Shading Ratio of Electrical-Visual StorageTubes 155

10 Measurement of Signal-to-Disturbance Ratio 155

10.1 Signal-to-Disturbance Ratio of Electrical-SignalStorage Tubes 155

10.2 Signal-to-Disturbance Ratio of Electrical-VisualStorage Tubes 155

11 Luminance of Electrical-Visual Storage Tubes 156

11.1 Maximum Luminance 156

11.2 Contrast Ratio 156

12 Measurement of Beam Curnt 156

13 Denitions 156